Target Thickness Dependence of Radiative Electron Capture in Heavy Ion Collision

Target Thickness Dependence of Radiative Electron Capture in Heavy Ion Collision
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重离子碰撞中辐射电子捕获的目标厚度依赖性

DOI:
10.1103/physrevlett.40.1174
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发表时间:
1978
影响因子:
1.5
通讯作者:
J. Tanis
J. Tanis
中科院分区:
物理与天体物理4区
文献类型:
--
作者:
J. Tanis

文献摘要

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我们展示了重离子诱导x射线产生截面的靶厚度依赖性如何用于将测量的K REC(辐射电子捕获)强度归一化为具有K空位的入射离子的比例。如果假设Cu中的所有M层和n层电子都参与了REC过程,则Cl离子在Cu靶上的REC实验截面与Bethe和Salpeter的自由电子理论很好地吻合。
We show how the target-thickness dependence of heavy-ion -induced x-ray production cross sections can be used to normalize the measured K REC (radiative electron capture) intensity to the fraction of incident ions with K vacancies. Experimental REC cross sections for Cl ions on Cu targets are in good agreement with the free-electron theory of Bethe and Salpeter if it is asumed that all of the M- and N-shell electron in Cu contribute to the REC process.