Analysis of polarization by means of polarized cathodoluminescence spectroscopy in a TEM.
Analysis of polarization by means of polarized cathodoluminescence spectroscopy in a TEM.
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通过 TEM 中的偏振阴极发光光谱分析偏振。
DOI：
10.1093/jmicro/51.5.281
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发表时间：
2002
期刊：
影响因子：
--
通讯作者：
S. Takeda
中科院分区：
文献类型：
--
作者：
Y. Ohno;S. Takeda
我们已经开发了一种新的方法来确定从纳米有序空间发射的光的偏振材料通过偏振阴极发光（CL）光谱与透射电子显微镜中的椭球镜。我们已经表明，在充分考虑的影响，在椭球镜的反射CL强度的模拟是必要的，以确定偏振。
We have developed a novel method to determine the polarization of light emitted from nanometre-ordered spaces in materials by means of polarized cathodoluminescence (CL) spectroscopy with an ellipsoidal mirror in a transmission electron microscope. We have shown that simulation of CL intensities in full consideration of the effect of reflection on an ellipsoidal mirror is necessary to determine the polarization.