Microstructure, Density, and Dielectric Properties of Lead‐Free (K0.44Na0.52Li0.04)(Nb0.96−xTaxSb0.04)O3 Piezoelectric Ceramics
Microstructure, Density, and Dielectric Properties of Lead‐Free (K0.44Na0.52Li0.04)(Nb0.96−xTaxSb0.04)O3 Piezoelectric Ceramics
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DOI：
10.1111/j.1551-2916.2007.01631.x
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发表时间：
2007-05
影响因子：
3.9
通讯作者：
Yunfei Chang;Zupei Yang;Lingling Wei
中科院分区：
文献类型：
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作者：
Yunfei Chang;Zupei Yang;Lingling Wei
无铅（K0.44Na0.52Li0.04）（Nb0.96-xTaxSb0.04）O3压电陶瓷通过常规固态烧结方法制备。Ta替代Nb后，陶瓷的晶粒长大受到抑制，致密度提高。增加x导致极化前后介电性质的不同变化，并阻止正交-四方晶系相变的发生（在To−t）。所有的陶瓷都表现出介于正常和理想弛豫铁电体之间的中间弛豫行为。在x=0.20的陶瓷中获得了显著增强的介电和压电性能。该陶瓷是一种非常有前途的机电器件无铅材料。
Lead-free (K0.44Na0.52Li0.04) (Nb0.96−xTaxSb0.04)O3 piezoelectric ceramics were prepared by the conventional solid-state sintering method. The grain growth of the ceramics was inhibited and the relative density was improved with Ta substituting for Nb. Increasing x led to different variations of dielectric properties before and after poling, and prevented the occurrence of orthorhombic–tetragonal phase transition (at To−t). All the ceramics show an intermediate relaxor-like behavior between normal and ideal relaxor ferroelectrics. Significantly enhanced dielectric and piezoelectric properties were obtained in the ceramics with x=0.20. The ceramics are very promising lead-free materials for electromechanical device applications.