Moritoshi Yasunaga, et al.: "SOM (Self-Organizing Map) Implemented by Wafer Scale Integration Its Self-Organizing Behavior under Defects" Proc.Int.Conf.Innovative Systems in Silicon. 323-329 (1996)
Moritoshi Yasunaga, et al.: "SOM (Self-Organizing Map) Implemented by Wafer Scale Integration Its Self-Organizing Behavior under Defects" Proc.Int.Conf.Innovative Systems in Silicon. 323-329 (1996)
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Moritoshi Yasunaga 等人：“通过晶圆级集成实现的 SOM（自组织映射）及其在缺陷下的自组织行为”Proc.Int.Conf.Innovative Systems in Silicon。
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