Serial position effects in implicit and explicit tests of memory.
Serial position effects in implicit and explicit tests of memory.
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内隐和外显记忆测试中的串行位置效应。
DOI：
10.1037//0278-7393.20.6.1370
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发表时间：
1994
期刊：
影响因子：
--
通讯作者：
Shimamura,AP
中科院分区：
文献类型：
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作者：
Gershberg,FB;Shimamura,AP
本研究探讨了学习序列位置对内隐和外显记忆测验的影响。词干补全的内隐测验中既有首因效应，又有近因效应。然而，这些影响是短暂的。在测试的后半部分（实验1和3）或测试后1分钟，填充延迟（实验2）时，没有发现序列位置效应。在线索回忆的外显测验中也考察了序列位置效应。当外显线索回忆的表现低于上限水平时，首因效应在整个测试中持续存在（实验3）。同样，在自由回忆的外显测试中，无论是即时测试（实验1和3）还是填充延迟测试（实验2），都一致观察到了首因效应。
The effects of serial position at study on implicit and explicit tests of memory were investigated. Both primacy and recency effects were observed in implicit tests of word-stem completion. These effects, however, were transient. No serial position effects were found in the second half of testing (Experiments 1 and 3) or when testing followed a 1-min, filled delay (Experiment 2). Serial position effects were also examined in explicit tests of cued recall. When performance on explicit cued recall was below ceiling levels, a primacy effect persisted throughout testing (Experiment 3). Similarly, in explicit tests of free recall, primacy effects were consistently observed, both with immediate testing (Experiments 1 and 3) and when testing followed a filled delay (Experiment 2).