Intermolecular artifacts in probe microscope images of C 60 assemblies
Intermolecular artifacts in probe microscope images of C 60 assemblies
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DOI：
10.1103/physrevb.92.241405
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发表时间：
2015-12
影响因子：
3.7
通讯作者：
S. Jarvis;M. Rashid;A. Sweetman;J. Leaf;Simon Taylor;P. Moriarty;J. L. Dunn
中科院分区：
文献类型：
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作者：
S. Jarvis;M. Rashid;A. Sweetman;J. Leaf;Simon Taylor;P. Moriarty;J. L. Dunn
声称动态力显微镜有能力解决分子间键在现实空间继续激烈的辩论。迄今为止，研究仅限于相邻分子之间具有小间距的平面分子组装。在这里，我们报告了在二维C-60分子组装中观察到的更大距离的分子间伪影，并有令人信服的证据表明，在我们的情况下，尖端是由C-60分子终止的（而不是超高分辨率力显微镜中通常使用的CO终止）。完全没有定向相互作用，如氢或卤素键，C-60的非平面结构，以及尖端顶端的富勒烯终止，在我们的案例中突出了分子间伪影在动态力显微镜中无处不在。
Claims that dynamic force microscopy has the capability to resolve intermolecular bonds in real space continue to be vigorously debated. To date, studies have been restricted to planar molecular assemblies with small separations between neighboring molecules. Here we report the observation of intermolecular artifacts over much larger distances in 2D assemblies of C-60 molecules, with compelling evidence that in our case the tip apex is terminated by a C-60 molecule (rather than the CO termination typically exploited in ultrahigh resolution force microscopy). The complete absence of directional interactions such as hydrogen or halogen bonding, the nonplanar structure of C-60, and the fullerene termination of the tip apex in our case highlight that intermolecular artifacts are ubiquitous in dynamic force microscopy.