Terahertz material detection from diffuse surface scattering
Terahertz material detection from diffuse surface scattering
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DOI：
10.1063/1.3561806
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发表时间：
2011-05-01
影响因子：
3.2
通讯作者：
Kniffin, Gabriel P.
中科院分区：
文献类型：
--
作者：
Schecklman, Scott;Zurk, Lisa M.;Kniffin, Gabriel P.
太赫兹(THz)光谱探测爆炸物和其他感兴趣的材料的潜力因粗糙的表面散射而变得复杂。我们以前的工作已经证明，通过对漫反射观测角度和表面进行平均，可以从实验室测量和数值计算机模拟中恢复光谱特征。除了平均外，还使用了低通倒谱滤波来降低由于随机粗糙表面造成的噪声。本文利用随机粗糙表面的倒谱和目标材料的材料特性对这些概念进行了扩展，为滤波器选择了一个最佳截止频率。使用实验室测量和蒙特卡罗模拟对许多随机表面实现集进行评估，以评估这些技术的实用性。当入射和漫射散射角接近表面法线时，Kirchhoff近似被用来快速模拟具有逐渐起伏的粗糙表面的介质材料的漫射散射。从漫射太赫兹散射中恢复粗糙介电材料的光谱特征的能力可能会被证明对未来安全屏蔽系统的设计有用。(C)2011年美国物理研究所。[DOI：10.1063/1.3561806]
The potential for terahertz (THz) spectroscopy to detect explosives and other materials of interest is complicated by rough surface scattering. Our previous work has demonstrated that by averaging over diffuse observation angles and surfaces, spectral features could be recovered from laboratory measurements and numerical computer simulations. In addition to averaging, a low-pass cepstrum filter was used to reduce noise due to the random rough surface. This paper expands on these concepts by using the cepstrum of both the random rough surface and the material properties of the target material to choose an optimal cutoff frequency for the filter. The utility of these techniques is evaluated using laboratory measurements and Monte Carlo simulations for many sets of random surface realizations. The Kirchhoff Approximation is used to quickly model diffuse scattering from dielectric materials with gradually undulating rough surfaces when the incident and diffuse scattering angles are near the surface normal. The ability to recover the spectral features of rough dielectric materials from diffuse THz scattering may prove useful for the design of future security screening systems. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3561806]