Mechanism of liquid crystal alignment on submicron patterned surfaces
Mechanism of liquid crystal alignment on submicron patterned surfaces
复制标题
DOI：
10.1063/1.1335649
复制
发表时间：
2001-01-15
影响因子：
3.2
通讯作者：
Rasing, T
中科院分区：
文献类型：
--
作者：
Rastegar, A;Skarabot, M;Rasing, T
通过偏光光学显微镜研究了使用原子力显微镜 (AFM) 尖端图案化的聚合物表面上液晶的排列机制。根据聚合物的厚度，聚合物链排列或凹槽似乎是液晶排列的原因。在厚聚合物薄膜（超过 100 nm）中，由于尖端施加的较大侧向力，聚合物链将沿扫描方向排列。在聚合物薄膜（5-20 nm）中，聚合物链牢固地固定在表面上，不会通过尖端重新排列；相反，将形成凹槽。锚定厚聚合物膜的能量的方位角表面不依赖于扫描线间隔和扫描力，与传统摩擦的聚酰亚胺表面具有相同的数量级，但随着扫描次数的增加而增加。 AFM 图案像素不显示预倾角。 (C) 2001 年美国物理研究所。
The alignment mechanism of liquid crystals on polymeric surfaces that were patterned using an atomic force microscope (AFM) tip was studied by polarizing optical microscopy. Depending on the thickness of the polymer, polymer chain alignment or grooves appear to be responsible for the liquid crystal alignment. In thick polymer films (above 100 nm) the polymer chains will align in the direction of the scan due to the large lateral force exerted by the tip. In thin polymer films (5-20 nm) the polymer chains are strongly fixed to the surface and will not realign by the tip; instead grooves will be formed. The azimuthal surface anchoring the energy of thick polymer films does not depend on the scan line separation and scan force, is of the same order of magnitude as for conventionally rubbed polyimide surfaces, but increases by the number of scans. AFM patterned pixels do not show a pretilt angle. (C) 2001 American Institute of Physics.