Enhanced radiation tolerance of an optically reconfigurable gate array by exploiting an inversion/ non-inversion implementation
Enhanced radiation tolerance of an optically reconfigurable gate array by exploiting an inversion/ non-inversion implementation
复制标题
通过利用反转/非反转实现增强光学可重构门阵列的辐射耐受性
DOI：
10.1007/978-3-319-05960-0_14
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发表时间：
2014
期刊：
影响因子：
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通讯作者：
M. Watanabe
中科院分区：
文献类型：
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作者：
T. Yoza;M. Watanabe
迄今为止，光学可重构门阵列（ORGAs）已被开发，以实现高可靠性的嵌入式系统。ORGA提供了现场可编程门阵列（FPGA）之外的许多有益功能：最重要的是，可以使用已被高能带电粒子损坏的包含错误的配置上下文来重新配置ORGA。ORGA的辐射耐受性非常高。此外，如果将反转/非反转实现架构引入到ORGA，则可以显著增加ORGA用于辐射的配置可靠性。因此，本文提出了一种增强的辐射耐受性的光学可重构门阵列实现利用反转/非反转实现的演示。
To date, optically reconfigurable gate arrays (ORGAs) have been developed to realize highly dependable embedded systems. ORGAs present many beneficial capabilities beyond those of field programmable gate arrays (FPGAs): The most important is that an ORGA can be reconfigured using an error-included configuration context that has been damaged by high-energy charged particles. The radiation tolerance of an ORGA is extremely high. Moreover, if an inversion/ non-inversion implementation architecture is introduced to an ORGA, the configuration dependability of the ORGA for radiation can be increased drastically. This paper therefore presents a demonstration of the enhanced radiation tolerance of an optically reconfigurable gate array achieved by exploiting the inversion/ non-inversion implementation.