QUANTITATIVE INTERPRETATION OF X-RAY-DIFFRACTION PATTERNS OF MIXTURES .3. SIMULTANEOUS DETERMINATION OF A SET OF REFERENCE INTENSITIES
QUANTITATIVE INTERPRETATION OF X-RAY-DIFFRACTION PATTERNS OF MIXTURES .3. SIMULTANEOUS DETERMINATION OF A SET OF REFERENCE INTENSITIES
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DOI：
10.1107/s0021889875009454
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发表时间：
1975-01-01
影响因子：
6.1
通讯作者：
CHUNG, FH
中科院分区：
文献类型：
--
作者：
CHUNG, FH
定量解释混合物的 X 射线衍射图样需要一组参考强度 ki。迄今为止，每个 ki 都是从一对一重量比的二元混合物中单独测定的。提出了同时确定所有感兴趣的 ki 的程序。多组分混合物的 X 射线衍射图通常包含重叠峰。通过选择混合物中已经存在的任意参考材料和/或直接使用最强的分辨反射，可以避免这种重叠问题。这些概念通过十个例子得到证实。基质冲洗方法的最大标准偏差估计为 8% 相对值。
A set of reference intensities, ki, are required for the quantitative interpretation of X-ray diffraction patterns of mixtures. Each ki was heretofore determined individually from binary mixtures of a one-to-one weight ratio. A procedure for the determination of all ki's of interest simultaneously is presented. The X-ray diffraction patterns of multicomponent mixtures usually contain overlapping peaks. This overlapping problem can be avoided by choosing an arbitrary reference material already present in the mixture and/or using the strongest resolved reflections directly. These concepts are substantiated by ten examples. The maximum standard deviation of the matrix-flushing method has been estimated to be 8% relative.