Understanding soft errors in uncore components
Understanding soft errors in uncore components
复制标题
了解非核心组件中的软错误
DOI:
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发表时间:
2015
期刊:
影响因子:
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通讯作者:
S. Mitra
中科院分区:
文献类型:
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作者:
Hyungmin Cho;Chen;Thomas Shepherd;S. Mitra
The effects of soft errors in processor cores have been widely studied. However, little has been published about soft errors in uncore components, such as memory subsystem and I/O controllers, of a System-on-a-Chip (SoC). In this work, we study how soft errors in uncore components affect system-level behaviors. We have created a new mixed-mode simulation platform that combines simulators at two different levels of abstraction, and achieves 20,000× speedup over RTL-only simulation. Using this platform, we present the first study of the system-level impact of soft errors inside various uncore components of a large-scale, multi-core SoC using the industrial-grade, open-source OpenSPARC T2 SoC design. Our results show that soft errors in uncore components can significantly impact system-level reliability. We also demonstrate that uncore soft errors can create major challenges for traditional system-level checkpoint recovery techniques. To overcome such recovery challenges, we present a new replay recovery technique for uncore components belonging to the memory subsystem. For the L2 cache controller and the DRAM controller components of OpenSPARC T2, our new technique reduces the probability that an application run fails to produce correct results due to soft errors by more than 100× with 3.32% and 6.09% chip-level area and power impact, respectively.