An in-plane magnetic chiral dichroism approach for measurement of intrinsic magnetic signals using transmitted electrons.
An in-plane magnetic chiral dichroism approach for measurement of intrinsic magnetic signals using transmitted electrons.
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使用透射电子测量本征磁信号的面内磁手性二色性方法
DOI：
10.1038/ncomms15348
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发表时间：
2017-05-15
影响因子：
16.6
通讯作者：
Zhu J
中科院分区：
文献类型：
--
作者：
Song D;Tavabi AH;Li ZA;Kovács A;Rusz J;Huang W;Richter G;Dunin-Borkowski RE;Zhu J
电子能量损失磁手性二色性是一种强大的技术，它允许在透射电子显微镜下以接近原子的空间分辨率和元素特异性定量测量材料的局部磁性。到目前为止，该技术仅限于测量电子束方向的磁圆二色性信号。然而，薄样品的本征磁化方向往往在试样平面内取向，特别是在无磁场条件下进行透射电镜检测时。在这里，我们介绍了一种方法，通过选择特定的衍射几何形状，使用电子磁性手性二色性来测量平面内磁信号。我们将钴纳米板的实验结果与模拟结果进行了比较，证明了可以成功地检测到由面内磁化产生的电子磁性手性二色信号。
Electron energy-loss magnetic chiral dichroism is a powerful technique that allows the local magnetic properties of materials to be measured quantitatively with close-to-atomic spatial resolution and element specificity in the transmission electron microscope. Until now, the technique has been restricted to measurements of the magnetic circular dichroism signal in the electron beam direction. However, the intrinsic magnetization directions of thin samples are often oriented in the specimen plane, especially when they are examined in magnetic-field-free conditions in the transmission electron microscope. Here, we introduce an approach that allows in-plane magnetic signals to be measured using electron magnetic chiral dichroism by selecting a specific diffraction geometry. We compare experimental results recorded from a cobalt nanoplate with simulations to demonstrate that an electron magnetic chiral dichroism signal originating from in-plane magnetization can be detected successfully.