Electrical properties of CNx nanotubes probed in a transmission electron microscope
Electrical properties of CNx nanotubes probed in a transmission electron microscope
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DOI：
10.1007/s00339-007-4316-y
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发表时间：
2007-11
期刊：
影响因子：
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通讯作者：
P. Costa;D. Golberg;M. Mitome;Y. Bando
中科院分区：
文献类型：
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作者：
P. Costa;D. Golberg;M. Mitome;Y. Bando
了解一维纳米结构的机械和电气特性对其未来在纳米电子电路中的集成至关重要。本研究在透射电子显微镜下分析了n掺杂碳纳米管（CNx,x<0.1）在外加应力下的行为。观察到的电阻变化很大，其数值范围从42到182 k Ω，并且在很大程度上与接触面积的扩展（电极-纳米管或纳米管-纳米管）相关。尽管重复的变形周期和高弯曲角度，纳米管始终保持其金属性质。除此之外，还注意到CNxnanotubes在其受控弯曲过程中呈现出具有几个结构缺陷的部分，这些结构缺陷充当了关节。这些区域代表高阻点，可能导致致命的结构破坏，正如本文报道的电流诱导破坏实验所证明的那样。
Knowledge of the mechanical and electrical characteristics of one-dimensional nanostructures is critical for their future integration in nanoelectronic circuits. The present study analyses the behaviour of N-doped carbon nanotubes (CNx,x<0.1) under applied stresses inside a transmission electron microscope. The electrical resistance changes observed were substantial, with figures ranging from 42 to 182 k Ω, and are largely correlated with the extension of the contact area (electrode–nanotube or nanotube–nanotube). Despite the repeated deformation cycles and high bending angles achieved, the nanotubes kept their metallic nature throughout. In addition to this, it was noticed that the CNxnanotubes presented sections with several structural defects which acted as joints during their controlled bending. These areas represent high-resistive points which may lead to fatal structural failure, as demonstrated in the current induced failure experiments here reported.