A proof of the metric properties of the symmetric scaling‐nesting dissimilarity measure and related symmetry deficiency measures
A proof of the metric properties of the symmetric scaling‐nesting dissimilarity measure and related symmetry deficiency measures
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对称标度嵌套相异性测度及相关对称缺陷测度的度量属性证明
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发表时间：
1997
期刊：
影响因子：
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通讯作者：
P. Mezey
中科院分区：
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作者：
P. Mezey
早期提出了缩放嵌套相似性度量，用于对等密度表面包围的分子“体”进行直观简单的形状比较。相似性度量具有扩展的实用性并提供严格的比较，如果它们满足度量的条件，则可以通过众所周知的数学技术进行处理。这里，提出了一个证明，表明对称缩放嵌套相异性度量确实是一个合适的度量。讨论了与这些相似性度量的新证明的属性相关的一些附加特征。 © 1997 约翰威利父子公司。
The scaling-nesting similarity measures were proposed earlier for an intuitively simple shape comparison of molecular “bodies” enclosed by isodensity surfaces. Similarity measures have extended utility and provide rigorous comparisons which can be treated by well-known mathematical techniques if they fulfill the conditions for a metric. Here, a proof is presented showing that the symmetric scaling-nesting dissimilarity measure is indeed a proper metric. Some additional features, relevant to the newly proven properties of these similarity measures, are discussed. © 1997 John Wiley & Sons, Inc.