Quantitative Conductivity Mapping of SrTiO3–LaAlO3–LaTiO3 Ternary Composition-Spread Thin Film by Scanning Microwave Microscope
Quantitative Conductivity Mapping of SrTiO3–LaAlO3–LaTiO3 Ternary Composition-Spread Thin Film by Scanning Microwave Microscope
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DOI：
10.1143/apex.1.055003
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发表时间：
2008-04
影响因子：
2.3
通讯作者：
S. Okazaki;N. Okazaki;Y. Hirose;J. Nishimura;K. Ueno;A. Ohtomo;M. Kawasaki;H. Koinuma;T. Hasegawa
中科院分区：
文献类型：
--
作者：
S. Okazaki;N. Okazaki;Y. Hirose;J. Nishimura;K. Ueno;A. Ohtomo;M. Kawasaki;H. Koinuma;T. Hasegawa
利用扫描微波显微镜（SµM）对SrTiO 3-LaAlO 3-LaTiO 3（STO-LAO-LTO）三元复合铺展薄膜的电导率σ进行了定量作图。根据Q值的偏移，参照标准的Ti 1-xNb xO 2组成分散薄膜来评估σ。三元体系的分析结果与文献中STO-LAO和STO-LTO二元体系的σ值吻合良好，证实了本分析方法的准确性。根据定量的膜电导率数据，提出了三元体系的电相图。在STO-LTO侧的大范围内观察到了金属导电，当LAO组分超过约100时，金属导电转变为跳跃导电。百分之三十五
We carried out quantitative mapping of conductivity σ for the SrTiO3–LaAlO3–LaTiO3 (STO–LAO–LTO) ternary composition-spread thin film by using the scanning microwave microscope (SµM). The σ was evaluated from the shifts in Q-value with reference to the standard Ti1-xNbxO2 composition-spread thin film. Results for the ternary system showed excellent agreement with the literature values of σ in the binary STO–LAO and STO–LTO systems, confirming the accuracy of the present analysis method. An electric phase diagram was proposed for the ternary system based on the quantitative film-conductivity data. Metallic conduction in the ternary system was observed in a wide area close to the STO–LTO side, which gave way to the hopping conduction if LAO component exceeded ca. 35%.