Continuous motion scan ptychography: characterization for increased speed in coherent x-ray imaging

Continuous motion scan ptychography: characterization for increased speed in coherent x-ray imaging
复制标题

DOI:
10.1364/oe.23.005438
复制
发表时间:
2015-03-09
期刊:
影响因子:
3.8
通讯作者:
Vine, David J.
Vine, David J.
中科院分区:
物理与天体物理2区
文献类型:
--
作者:
Deng, Junjing;Nashed, Youssef S. G.;Vine, David J.

文献摘要

被引文献

相似文献

重叠关联成像(Ptychography)是一种用于扩展物体的相干衍射成像(CDI)方法,其中衍射图案从重叠的相干照明光斑顺序获取。物体的复透射函数可以从这些衍射图案中以仅受物体的散射强度和检测器几何形状限制的空间分辨率重建。迄今为止,大多数实验已经使用移动-固定-测量序列来定位样品上的照明光斑,其中移动和固定步骤可能比测量步骤花费更长的时间来完成。我们在这里描述了使用一个连续的“飞扫描”模式的重叠关联数据收集中的样品被连续移动,使实验类似于从多个探头位置的衍射图案的集成之一。这允许使用多个探测模式重建方法来获得对象的图像以及照明函数的图像。我们在模拟中,并在X射线成像实验中,一些特点的飞扫描重叠,包括一个因素的25减少数据采集时间。随着更明亮的X射线源的发展,这种方法将变得越来越重要,例如衍射限制存储环。(C)2015美国光学学会
Ptychography is a coherent diffraction imaging (CDI) method for extended objects in which diffraction patterns are acquired sequentially from overlapping coherent illumination spots. The object's complex transmission function can be reconstructed from those diffraction patterns at a spatial resolution limited only by the scattering strength of the object and the detector geometry. Most experiments to date have positioned the illumination spots on the sample using a move-settle-measure sequence in which the move and settle steps can take longer to complete than the measure step. We describe here the use of a continuous "fly-scan" mode for ptychographic data collection in which the sample is moved continuously, so that the experiment resembles one of integrating the diffraction patterns from multiple probe positions. This allows one to use multiple probe mode reconstruction methods to obtain an image of the object and also of the illumination function. We show in simulations, and in x-ray imaging experiments, some of the characteristics of fly-scan ptychography, including a factor of 25 reduction in the data acquisition time. This approach will become increasingly important as brighter x-ray sources are developed, such as diffraction limited storage rings. (C) 2015 Optical Society of America