Orientational ordering in the chiral smectic-C*FI2 liquid crystal phase determined by resonant polarized x-ray diffraction.
Orientational ordering in the chiral smectic-C*FI2 liquid crystal phase determined by resonant polarized x-ray diffraction.
复制标题
通过共振偏振 X 射线衍射测定手性近晶-C*FI2 液晶相的取向顺序。
DOI：
10.1103/physreve.64.050702
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发表时间：
2001
期刊：
影响因子：
--
通讯作者：
C. C. Huang
中科院分区：
文献类型：
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作者：
A. Cady;J. Pitney;R. Pindak;L. S. Matkin;S. J. Watson;H. Gleeson;P. Cluzeau;P. Barois;A. Levelut;W. Caliebe;J. Goodby;M. Hird;C. C. Huang
在具有手性近晶-C*FI2相的自支撑液晶薄膜上进行了硫K边附近的高分辨率共振偏振X射线衍射实验。人们普遍认为，这一阶段有一个四层重复单元，但重复单元的内部结构仍然存在争议。我们报道了与近晶-C*FI2相有关的共振X射线衍射峰的不同分辨特征，这些特征明确地证明了四层重复单元是关于层法线的局部双轴的，并且测量的角度描述了双轴性，与光学测量很好地一致。
High-resolution resonant polarized x-ray diffraction experiments near the sulfur K edge have been performed on free-standing liquid crystal films exhibiting the chiral smectic-C*FI2 phase. It is widely accepted that this phase has a four-layer repeat unit, but the internal structure of the repeat unit remains controversial. We report different resolved features of the resonant x-ray diffraction peaks associated with the smectic-C*FI2 phase that unambiguously demonstrate that the four-layer repeat unit is locally biaxial about the layer normal and that the measured angle, describing the biaxiality, is in good agreement with optical measurements.