Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation technique

Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation technique
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DOI:
10.1364/oe.18.026625
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发表时间:
2010-12-06
期刊:
影响因子:
3.8
通讯作者:
De la Rue, R. M.
De la Rue, R. M.
中科院分区:
物理与天体物理2区
文献类型:
--
作者:
Ding, W.;Gorbach, A. V.;De la Rue, R. M.

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