Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation technique
Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation technique
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DOI:
10.1364/oe.18.026625
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发表时间:
2010-12-06
期刊:
影响因子:
3.8
通讯作者:
De la Rue, R. M.
中科院分区:
文献类型:
--
作者:
Ding, W.;Gorbach, A. V.;De la Rue, R. M.
We report time domain measurements of the group-velocity-dispersion-induced and nonlinearity-induced chirping of femtosecond pulses in subwavelength silicon-on-insulator waveguides. We observe that at a critical input power level, these two effects compensate each other leading to soliton formation. Formation of the fundamental optical soliton is observed at a peak power of a few Watts inside the waveguide. Interferometric cross-correlation traces reveal compression of the soliton pulses, while spectral measurements show pronounced dispersive (Cherenkov) waves emitted by solitons into the wavelength range of normal group velocity dispersion. (C) 2010 Optical Society of America