K.Kuroda: "Application of focused ion beam milling to cross-sectional TEM specimen preparation of industial materials including hetero-interfaces" Thin Solid Films. (in press). (1998)
K.Kuroda: "Application of focused ion beam milling to cross-sectional TEM specimen preparation of industial materials including hetero-interfaces" Thin Solid Films. (in press). (1998)
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K.Kuroda：“聚焦离子束铣削在工业材料（包括异质界面）横截面 TEM 样品制备中的应用”固体薄膜。
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