Growth and characterization on M-type hexaferrite single crystals
Growth and characterization on M-type hexaferrite single crystals
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M型六方铁氧体单晶的生长和表征
DOI：
10.1109/tmag.1987.1065597
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发表时间：
1987
影响因子：
2.1
通讯作者：
M. Labeyrie
中科院分区：
文献类型：
--
作者：
T. Robinson;M. Labeyrie
本文对在不同助熔剂中自由形核的六角锶铁氧体单晶和从铁酸钠助熔剂中提拉的六角锶铁氧体单晶在90 ~ 100 GHz之间的磁损耗和介电损耗进行了比较研究。晶体生长条件进行了描述和晶体的X射线和杂质分析的结果。为了准确地比较磁损耗，测量球的表面结构对测量线宽的影响进行了评估。从铁酸钠和氧化钠熔剂中获得的晶体损失之间没有显着差异。氧化硼焊剂的稍高损失可能是由于二价铁或第二相的存在。
A comparative study has been carried out of the magnetic and dielectric losses between 90 and 100 GHz for strontium hexaferrite single crystals freely nucleated in differents fluxes and pulled from a sodium ferrite flux. The crystal growth conditions are described and the results of X-ray and impurity analyses of the crystals presented. To accurately compare the magnetic losses, the influence of the surface structure of the measurement sphere on the measured linewidths has been evaluated. No significant difference was found between the losses of crystals obtained from sodium ferrite and sodium oxide fluxes. Slightly higher losses for a boron oxide flux could be due to the presence of divalent iron or a second phase.