The brightness temperature adjusted dust index: An improved approach to detect dust storms using MODIS imagery
The brightness temperature adjusted dust index: An improved approach to detect dust storms using MODIS imagery
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亮度温度调节沙尘指数:使用 MODIS 图像检测沙尘暴的改进方法
DOI:
10.1016/j.jag.2016.12.016
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发表时间:
2017-05
影响因子:
7.5
通讯作者:
Zhang Qiaofeng
中科院分区:
文献类型:
--
作者:
Yue Huanbi;He Chunyang;Zhao Yuanyuan;Ma Qun;Zhang Qiaofeng
Moderate Resolution Imaging Spectroradiometer (MODIS) imagery provides a good data source for timely and accurate monitoring of dust storms. However, effective MODIS-based dust indices are inadequate. In this study, we proposed an improved brightness temperature adjusted dust index (BADI) by integrating the brightness temperatures of three thermal infrared MODIS bands: band20(3.66–3.84 μm), band31(10.78–11.28 μm) and band32(11.77–12.27 μm). We used the BADI to monitor several representative dust storms over the Northeast Asia between 2000 and 2011. When compared to commonly used MODIS-based dust indices, such as the brightness temperature difference index in band32and band31(BTD32-31) and the normalized difference dust index (NDDI), the BADI captured the spatial extent and density of dust storms more accurately. The BADI detected dust storm extent with an overall accuracy >90%, which was 7% and 29% higher than the results derived from BTD32-31and NDDI, respectively. The BADI also demonstrated good agreement with the density indicator of MODIS Deep Blue Aerosol Optical Depth (R2= 0.59, P < 0.01). We suggest that the BADI is an effective tool to monitor large-scale dust storms.
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影响因子:
13.5
作者:
Huang, Jianping;Ge, Jinming;Weng, Fuzhong
通讯作者:
Weng, Fuzhong
影响因子:
--
作者:
X. Yue;Huijun Wang;H. Liao;K. Fan
通讯作者:
X. Yue;Huijun Wang;H. Liao;K. Fan
影响因子:
13.5
作者:
S. Ackerman
通讯作者:
S. Ackerman
DOI:
10.1016/j.gloplacha.2006.02.014
发表时间:
2006-07
期刊:
--
影响因子:
--
作者:
Peng Zhang;Naimeng Lu;Xiuqing Hu;C. Dong
通讯作者:
Peng Zhang;Naimeng Lu;Xiuqing Hu;C. Dong
影响因子:
11.4
作者:
C. Ro;H. Hwang;Hyekyeong Kim;Y. Chun;R. Van Grieken
通讯作者:
C. Ro;H. Hwang;Hyekyeong Kim;Y. Chun;R. Van Grieken