Transient deformation analysis by a carrier method of pulsed electronic speckle-shearing pattern interferometry.
Transient deformation analysis by a carrier method of pulsed electronic speckle-shearing pattern interferometry.
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DOI：
10.1364/ao.37.004116
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发表时间：
1998-07
期刊：
影响因子：
1.9
通讯作者：
A. Dávila;G. H. Kaufmann;C. Pérez-López
中科院分区：
文献类型：
--
作者：
A. Dávila;G. H. Kaufmann;C. Pérez-López
将脉冲激光引入电子散斑剪切图案干涉仪，可以测量高速的瞬时变形。我们报告了一个计算机化的系统，它允许通过平移发散透镜引入载波条纹来自动减少数据。采用空间同步检测法对形变相图进行定量测定。对金属板在电磁锤作用下的瞬时变形的实验结果表明了该系统的优越性。
The introduction of a pulsed laser into an electronic speckle-shearing pattern interferometer allows high-speed transient deformations to be measured. We report on a computerized system that permits automatic data reduction by introducing carrier fringes through the translation of a diverging lens. The quantitative determination of the phase map that is due to deformation is carried out by the spatial synchronous detection method. Experimental results obtained for a metal plate transiently deformed by an electromagnetic hammer illustrate the advantages of the proposed system.