A Feasible Surface Patterning Method for SEM-DIC: Achieving High-Resolution In Situ Mapping of Local Strain and Microstructure to Reveal the Effect of Slip Transfer on Shear Strain Near Grain Boundaries
A Feasible Surface Patterning Method for SEM-DIC: Achieving High-Resolution In Situ Mapping of Local Strain and Microstructure to Reveal the Effect of Slip Transfer on Shear Strain Near Grain Boundaries
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DOI：
10.1017/s1431927622000575
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发表时间：
2022-05
影响因子：
2.8
通讯作者：
Hao Ding;X. Cui;Yuchen Wang;Delong Cai;Zhiqi Wang;Yuanyuan Zhang;Lujun Huang;L. Geng
中科院分区：
文献类型：
--
作者：
Hao Ding;X. Cui;Yuchen Wang;Delong Cai;Zhiqi Wang;Yuanyuan Zhang;Lujun Huang;L. Geng
摘要本文利用一种新的方法制备高质量的散斑图，通过将纳米二氧化硅颗粒均匀分散在样品表面，帮助数字图像相关（DIC）获得最大的局部应变空间分辨率高达92 nm。将这种散斑图制作方法与SEM-DIC和电子背散射衍射（EBSD）相结合，进行了实例研究。从而实现了工业纯钛塑性变形过程中局部应变和微观组织的超高空间分辨率原位成像，有利于揭示滑移传递对晶界附近剪切应变的影响。此外，通过SEM-DIC和EBSD技术的结合，可以很容易地识别滑移系统，即使没有明显的变形痕迹，在二次电子图像捕获。此外，提出了与几何协调因子（m）和Schmid因子相关的复几何协调因子$（{m}^{\prime}_c）$来预测晶界处的剪切应变（εxy）。
Abstract This paper exploited an alternative approach to prepare high-quality speckle patterns by uniformly dispersing nano-silica particles onto sample surfaces, helping digital image correlation (DIC) acquire the maximum spatial resolution of local strain up to 92 nm. A case study was carried out by combining this speckle pattern fabrication method with SEM-DIC and electron backscattering diffraction (EBSD). Thus, in situ mapping of local strain with ultra-high spatial resolution and microstructure in commercially pure titanium during plastic deformation could be achieved, which favored revealing the effect of slip transfer on shear strain near grain boundaries. Moreover, the slip systems could be easily identified via the combination of the SEM-DIC and EBSD techniques even though no obvious deformation trace was captured in secondary electron images. Additionally, the complex geometric compatibility factor $( {m}^{\prime}_c)$ relating to geometric compatibility factors (mʹ) and Schmid factors was proposed to predict the shear strain (εxy) at grain boundaries.