Leakage current in quantum-cascade lasers through interface roughness scattering

Leakage current in quantum-cascade lasers through interface roughness scattering
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量子级联激光器中通过界面粗糙度散射产生的漏电流

DOI：
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发表时间：
2013
期刊：
影响因子：
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通讯作者：
W. Masselink
W. Masselink
中科院分区：
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文献类型：
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作者：
Y. Flores;S. Kurlov;M. Elagin;M. Semtsiv;W. Masselink

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从实验和理论上证明和分析了界面粗糙度（IFR）散射对量子级联激光器（QCL）量子效率的影响。在液氮温度下，对波长为5.4 μm的InGaAs/InAlAs应变补偿QCL进行了脉冲模式分析。作为激光谐振腔长度的函数的微分斜率效率的测量允许作为电子温度的函数的泵浦效率被测量。当通过IFR散射将泄漏电流计算到更高的状态时，获得了很好的一致性，提供了IFR散射对QCL量子效率的重要性的证据。
The impact of interface roughness (IFR)-scattering on the quantum efficiency of quantum-cascade lasers (QCLs) is demonstrated and analyzed both experimentally and theoretically. An InGaAs/InAlAs strain-compensated QCL emitting at λ ∼ 5.4 μm is analyzed in pulsed mode at liquid nitrogen temperatures. Measurements of the differential slope efficiency as a function of laser resonator length allow the pumping efficiency to be measured as a function of electron temperature. Excellent agreement is obtained when comparing the data to a calculation of the leakage current into higher-lying states via IFR-scattering, providing evidence of the importance of IFR-scattering on the QCLs quantum efficiency.