Electron Backscatter Diffraction Applied to Lithium Sheets Prepared by Broad Ion Beam Milling
Electron Backscatter Diffraction Applied to Lithium Sheets Prepared by Broad Ion Beam Milling
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DOI：
10.1002/jemt.22441
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发表时间：
2015-01-01
影响因子：
2.5
通讯作者：
Gauvin, Raynald
中科院分区：
文献类型：
--
作者：
Brodusch, Nicolas;Zaghib, Karim;Gauvin, Raynald
由于锂的硬度和原子序数很低，在扫描电子显微镜分析之前，无法用传统方法制备纯锂。本文用电子背散射衍射(EBSD)和X射线能谱(EDS)对锂离子电池技术中用作基极的纯锂金属薄片进行了表征，并用能量色散光谱(EDS)进行了微区分析。无需研磨和抛光即可实现表面分析所需的充分无损伤。根据EDS结果可以对杂质进行表征，EBSD准确地揭示了该材料的显微组织和微织构。由于大量使用IM和将样品转移到显微镜腔中而导致的光束损伤和氧化/水合作用估计为
Due to its very low hardness and atomic number, pure lithium cannot be prepared by conventional methods prior to scanning electron microscopy analysis. Here, we report on the characterization of pure lithium metallic sheets used as base electrodes in the lithium-ion battery technology using electron backscatter diffraction (EBSD) and X-ray microanalysis using energy dispersive spectroscopy (EDS) after the sheet surface was polished by broad argon ion milling (IM). No grinding and polishing were necessary to achieve the sufficiently damage free necessary for surface analysis. Based on EDS results the impurities could be characterized and EBSD revealed the microsctructure and microtexture of this material with accuracy. The beam damage and oxidation/hydration resulting from the intensive use of IM and the transfer of the sample into the microscope chamber was estimated to be