Enhanced Bragg reflections from size-matched heterostructure photonic crystal thin films prepared by the Langmuir-Blodgett method
Enhanced Bragg reflections from size-matched heterostructure photonic crystal thin films prepared by the Langmuir-Blodgett method
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DOI：
10.1063/1.2339031
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发表时间：
2006-08-28
影响因子：
4
通讯作者：
Whitehead, D. E.
中科院分区：
文献类型：
--
作者：
Bardosova, M.;Pemble, M. E.;Whitehead, D. E.
采用Langmuir-Blodgett方法设计了AB结构的光子晶体薄膜。通过透射光谱和反射光谱研究了结构。对于其中二氧化硅颗粒直径B是A的两倍的AB结构，仅当从结构的A侧探测该结构时才观察到与“A”域的一阶布拉格峰相关的反射率特征。此外，与仅由A颗粒组成的结构相比，该特征在强度上增强。这些发现归因于一阶和二阶布拉格过程的匹配。(c)2006年，美国物理学会。
The Langmuir-Blodgett method was used to engineer photonic crystal thin films of an AB architecture. Structures were studied by transmittance and reflectance spectroscopies. For an AB structure in which the silica particle diameter B is twice that of A, reflectance features associated with the first order Bragg peak for the "A" domain are only observed when the structure is probed from the A side of the structure. Furthermore, this feature is enhanced in intensity compared to that for a structure consisting solely of A particles. These findings are attributed to a matching of first and second order Bragg processes. (c) 2006 American Institute of Physics.