Response compaction with any number of unknowns using a new LFSR architecture
Response compaction with any number of unknowns using a new LFSR architecture
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使用新的 LFSR 架构对任意数量的未知数进行响应压缩
DOI：
10.1145/1065579.1065614
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发表时间：
2005
期刊：
影响因子：
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通讯作者：
S. Mitra
中科院分区：
文献类型：
--
作者：
E. Volkerink;S. Mitra
本文提出了一种新的测试响应压缩技术，该技术在测试响应位中包含任意数量的未知逻辑值。该技术利用X-compact响应压缩器（X-compact），并将X-compact不能容忍的X强制为已知值。指定X压缩器不能容忍的X所需的数据，也称为掩码数据，以压缩格式存储在测试机上并在片上解压缩。作者将该技术应用于四个工业设计，测试响应数据量减少了26- 60倍，对测试质量没有影响。
This paper presents a new test response compaction technique with any number of unknown logic values (X's) in the test response bits. The technique leverages an X-tolerant response compactor (X-compact), and forces X's that are not tolerated by X-Compact to known values. The data required to designate the X's not tolerated by the X-compactor, also called mask data, is stored in a compressed format on the tester and decompressed on-chip. The authors applied this technique to four industrial designs and obtained 26-fold to 60-fold reduction in test response data volume with no impact on test quality.