Nonlinear imaging using annular dark field TEM
Nonlinear imaging using annular dark field TEM
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DOI：
10.1016/j.ultramic.2005.05.004
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发表时间：
2005-10-01
期刊：
影响因子：
2.2
通讯作者：
Kisielowski, C
中科院分区：
文献类型：
--
作者：
Bals, S;Kilaas, R;Kisielowski, C
环形暗场TEM图像表现出占主导地位的质量厚度对比度，可以量化提取单原子散射截面。在这个不相干的背景之上，出现了额外的晶格条纹，在150 kV下具有1.2埃的非线性信息极限。这些条纹的形成是由相干非线性成像理论和实验和模拟图像之间的良好协议。计算进一步预测，使用像差校正显微镜将显着提高图像质量。(c)2005 Elsevier B.V.保留所有权利。
Annular dark field TEM images exhibit a dominant mass-thickness contrast that can be quantified to extract single atom scattering cross sections. On top of this incoherent background, additional lattice fringes appear with a nonlinear information limit of 1.2 angstrom at 150 kV. The formation of these fringes is described by coherent nonlinear imaging theory and good agreement is found between experimental and simulated images. Calculations furthermore predict that the use of aberration corrected microscopes will improve the image quality dramatically. (c) 2005 Elsevier B.V. All rights reserved.