A millisecond x-ray reflectometer
A millisecond x-ray reflectometer
复制标题
毫秒X射线反射计
DOI：
10.1071/p98077
复制
发表时间：
1999
期刊：
影响因子：
--
通讯作者：
T. Dowling
中科院分区：
文献类型：
--
作者：
J. White;A. Brown;R. F. Garrett;D. King;T. Dowling
许多重要的过程发生在表面和界面上，时间尺度从毫秒到小时不等。第三代同步加速器的出现提供了足够高的X射线通量，现在可以想象，这些过程可以使用X射线反射计以毫秒级的时间分辨率进行研究。几种配置的X射线反射计设计来测量X射线反射率与此时间分辨率的配置进行检查。从反射率数据的信息检索方面的每个配置的可行性进行了探讨，模拟“实验”数据的建模技术的应用。
Many important processes occur at surfaces and interfaces on timescales ranging from milliseconds up to hours. The advent of third generation synchrotrons provides X-ray fluxes sufficiently high that it is now conceivable that these processes can be studied with millisecond time resolution using X-ray reflectometry. Several configurations for an X-ray reflectometer designed to measure X-ray reflectivity profiles with this time resolution are examined. The feasibility of each configuration in terms of information retrieval from reflectivity data is explored by application of modelling techniques to simulated ‘experimental’ data.