Strong-Field-Assisted Measurement of Near-Fields and Coherent Control of Photoemission at Nanometric Metal Tips
Strong-Field-Assisted Measurement of Near-Fields and Coherent Control of Photoemission at Nanometric Metal Tips
复制标题
纳米金属尖端近场的强场辅助测量和光电发射的相干控制
DOI:
10.1007/978-3-319-64840-8_8
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发表时间:
2017
期刊:
影响因子:
--
通讯作者:
Michael Förster
中科院分区:
文献类型:
--
作者:
Michael Förster
Metal nanotips are an ideal testbed for ultrafast and strong-field physics at solids due to the superb control they allow over their very apex and the near-field at this apex that enhances an incident laser field. Particular attention has recently been devoted to the study of laser-induced electron emission from nanotips, where an enhanced fundamental understanding contributes to the implementation of nanotips as a source of femtosecond electron pulses. In this chapter we present photoemission studies at nanotips illuminated with femtosecond lasers. We demonstrate a new technique to measure the strength of near-fields at nanostructures by using our knowledge of the occurring strong-field physics. Electrons rescattering with the surface of the nanotip after emission give access to the prevalent near-field intensity on the nanometer scale. Our measurements fit well with independent simulations of Maxwell’s equations. In the second part we show that by employing a synthesized light field of a fundamental and a second harmonic laser pulse we achieve almost perfect coherent control of the photoemission process. We demonstrate that we can interpret our findings in terms of interfering quantum pathways.
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影响因子:
3.2
作者:
Paarmann, A.;Gulde, M.;Ernstorfer, R.
通讯作者:
Ernstorfer, R.
影响因子:
16.6
作者:
Förg B;Schötz J;Süßmann F;Förster M;Krüger M;Ahn B;Okell WA;Wintersperger K;Zherebtsov S;Guggenmos A;Pervak V;Kessel A;Trushin SA;Azzeer AM;Stockman MI;Kim D;Krausz F;Hommelhoff P;Kling MF
通讯作者:
Kling MF
影响因子:
--
作者:
MULLER, EW;BAHADUR, K
通讯作者:
BAHADUR, K
影响因子:
8.6
作者:
Foerster, Michael;Paschen, Timo;Hommelhoff, Peter
通讯作者:
Hommelhoff, Peter