PICOSECOND RESOLUTION IN SCANNING-TUNNELING-MICROSCOPY
PICOSECOND RESOLUTION IN SCANNING-TUNNELING-MICROSCOPY
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DOI:
10.1126/science.262.5136.1029
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发表时间:
1993-11-12
期刊:
影响因子:
56.9
通讯作者:
FREEMAN, MR
中科院分区:
文献类型:
--
作者:
NUNES, G;FREEMAN, MR
A method has been developed for performing fast time-resolved experiments with a scanning tunneling microscope. The method uses the intrinsic nonlinearity in the microscope' s current versus voltage characteristics to resolve optically generated transient signals on picosecond time scales. The ability to combine the spatial resolution of tunneling microscopy with the time resolution of ultrafast optics yields a powerful tool for the investigation of dynamic phenomena on the atomic scale.