Ultrahigh vacuum cantilever magnetometry with standard size single crystal substrates
Ultrahigh vacuum cantilever magnetometry with standard size single crystal substrates
复制标题
标准尺寸单晶衬底超高真空悬臂磁力测量
DOI：
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发表时间：
2001
期刊：
影响因子：
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通讯作者：
J. Kirschner
中科院分区：
文献类型：
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作者：
Th. Höpfl;D. Sander;H. Höche;J. Kirschner
本文介绍了一种悬臂梁磁强计，它能测量具有亚单层灵敏度的铁磁薄膜的磁矩。磁力计被纳入到一个无源真空室样品制备和原位磁力测定。可以使用5 mm直径和2 mm厚度的标准尺寸单晶，其安装在薄金属片上。这种复合样品架作为一个悬臂梁时，弯曲是由一个外部磁场施加在单层铁磁薄膜沉积到单晶基板上的扭矩引起的。我们证明了在2到68个单层的厚度范围内，Cu（100）上的Fe单层的亚单层灵敏度。样品保持器设计用于内部校准，通过使电流通过并利用众所周知的电流感应磁矩。
A cantilever magnetometer is described that measures the magnetic moment of ferromagnetic films with submonolayer sensitivity. The magnetometer is incorporated into an ultrahigh vacuum chamber for sample preparation and in situ magnetometry. Standard size single crystals of 5 mm diameter and 2 mm thickness can be used, which are mounted on thin sheet metal. This composite sampleholder works as a cantilever when the bending is induced by the torque exerted by an external magnetic field on a monolayer ferromagnetic film deposited onto the single crystal substrate. We demonstrate the submonolayer sensitivity on Fe monolayers on Cu(100) in the thickness range from 2 to 68 monolayers. The sample holder is designed for internal calibration by passing a current through it and exploiting the well-known current induced magnetic moment.