The effect of finite film thickness on the surface segregation in symmetric binary polymer mixtures
The effect of finite film thickness on the surface segregation in symmetric binary polymer mixtures
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有限薄膜厚度对对称二元聚合物混合物表面偏析的影响
DOI：
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发表时间：
1993
期刊：
影响因子：
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通讯作者：
T. Russell
中科院分区：
文献类型：
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作者：
A. Hariharan;Sanat K. Kumar;M. Rafailovich;J. Sokolov;X. Zheng;D. Duong;S. Schwarz;T. Russell
我们报告了中子反射率和动态二次离子质谱测量的表面偏析对称，同位素聚苯乙烯共混物，自旋涂覆在氧化物覆盖的硅晶圆，作为膜厚度的函数。分析结果表明，氘化聚合物的段段总是在空气界面和衬底界面上分配。此外，如果薄膜厚度减小到相关长度的4倍以下，则表面偏析会受到显著影响，并且两个表面的偏析会随着厚度的减小而减小。这些结果与平均场晶格模型的预测很好地吻合，该模型结合了每个表面表面能参数χs的组成和链长无关值。
We report neutron reflectivity and dynamic secondary ion mass spectroscopy measurements of surface segregation from symmetric, isotopic polystyrene blends, spin coated onto oxide covered silicon wafers, as a function of film thickness. The results of this analysis show that the segments of the deuterated polymer always partition to both the air and the substrate interfaces. Furthermore, the surface segregation is affected significantly if the film thicknesses are reduced below ∼four times the correlation length in the systems, and the segregation to both surfaces decreases with decreasing thickness. These results are in good agreement with the predictions of a mean‐field lattice model which incorporates composition and chain length independent values of the surface energy parameter χs at each surface.