Improving Remote Sensing of Aerosol Optical Depth over Land by Polarimetric Measurements at 1640 nm: Airborne Test in North China
Improving Remote Sensing of Aerosol Optical Depth over Land by Polarimetric Measurements at 1640 nm: Airborne Test in North China
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DOI：
10.3390/rs70506240
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发表时间：
2015-05
期刊：
影响因子：
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通讯作者：
L. Qie;Zhengqiang Li;Xiaobing Sun;Bin Sun;Donghui Li;Zhao Liu;Wei Huang-;Han Wang;Xingfeng Chen-Xingfeng
中科院分区：
文献类型：
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作者：
L. Qie;Zhengqiang Li;Xiaobing Sun;Bin Sun;Donghui Li;Zhao Liu;Wei Huang-;Han Wang;Xingfeng Chen-Xingfeng
提出了一种改进的气溶胶反演算法的基础上先进的多角度偏振辐射计（APR），以说明使用查找表的方法测量气溶胶光学厚度（AOD）的附加1640 nm观测的效用。光谱中性的偏振表面反射率在可见光到短波长红外波段进行了验证，并校正了大气影响的1640 nm的测量被用来估计在较短的波长的偏振表面反射率。对京津冀地区大气偏振反射率的测量结果表明，当散射角小于145°时，670、865和1640 nm的偏振表面反射率具有很强的相关性，相关斜率接近1（0.985和1.03）。1640 nm的测量，然后估计偏振表面反射率在较短的波长为每个单一的观察方向，然后用于改善检索的AOD在陆地上。在三个实验飞行的APR检索和地面的太阳天空辐射计测量之间的比较表明，这种方法检索AOD在865 nm的不确定性范围从0.01到0.06，而AOD从0.05到0.17不等。
An improved aerosol retrieval algorithm based on the Advanced Multi-angular Polarized Radiometer (AMPR) is presented to illustrate the utility of additional 1640-nm observations for measuring aerosol optical depth (AOD) over land using look-up table approaches. Spectral neutrality of the polarized surface reflectance over visible to short-wavelength infrared bands is verified, and the 1640-nm measurements corrected for atmospheric effects are used to estimate the polarized surface reflectance at shorter wavelengths. The AMPR measurements over the Beijing-Tianjin-Hebei region in north China reveal that the polarized surface reflectance of 670, 865 and 1640 nm are highly correlated with correlation slopes close to one (0.985 and 1.03) when the scattering angle is less than 145°. The 1640-nm measurements are then employed to estimate polarized surface reflectance at shorter wavelengths for each single viewing direction, which are then used to improve the retrieval of AOD over land. The comparison between AMPR retrievals and ground-based Sun-sky radiometer measurements during three experimental flights illustrates that this approach retrieves AOD at 865 nm with uncertainties ranging from 0.01 to 0.06, while AOD varies from 0.05 to 0.17.