Smart Stress-Memory Patch for Fatigue Damage of Structure
Smart Stress-Memory Patch for Fatigue Damage of Structure
复制标题
用于结构疲劳损伤的智能应力记忆补丁
DOI：
10.2320/matertrans.i-mra2007853
复制
发表时间：
2007
影响因子：
1.2
通讯作者：
M. Enoki
中科院分区：
文献类型：
--
作者：
S. Nambu;M. Enoki
提出了一种新型的疲劳传感器--“智能应力记忆贴片”，该传感器通过测量裂纹长度和声发射（AE）来估计疲劳循环次数、应力幅值和最大应力，可用于桥梁、船舶等基础设施的疲劳损伤评估。研究了用于该传感器的电沉积（艾德）薄Cu试样的疲劳裂纹扩展行为。由于补片的疲劳裂纹扩展行为受最大应力和应力比的影响，提出了修正应力强度因子来引入疲劳裂纹扩展主曲线。通过声发射信号的测量，估算了声发射起始应力，并对艾德铜试样的Kaiser效应进行了检验。预计该贴片可以估计疲劳载荷下的循环次数、应力幅值和最大应力。
A new fatigue sensor called "smart stress-memory patch", which can estimate the cyclic number, the stress amplitude and the maximum stress from the measurement of crack length and acoustic emission (AE), is proposed to evaluate the fatigue damage of such infrastructure as bridges and ships. The fatigue crack growth behavior of thin electrodeposited (ED) Cu specimen for this sensor is investigated. The modified stress intensity factor is proposed to introduce the master curve of fatigue crack growth, because the fatigue crack growth behavior of this patch is affected by the maximum stress and stress ratio. AE signals are also measured to estimate the AE onset stress and examine Kaiser effect of ED Cu specimen. It is expected that the cyclic number, the stress amplitude and the maximum stress in fatigue loading can be estimated by this patch.
Y. Murakami：“核原癌基因 c-jun 和 c-fos，作为 DNA 复制的调节因子。”
DOI：
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发表时间：
--
期刊：
影响因子：
--
作者：
通讯作者：
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影响因子：
1.2
作者：
Ito, Kaita;Enoki, Manabu
通讯作者：
Enoki, Manabu