A Reliability Enhanced Address Mapping Strategy for Three-dimensional (3D) NAND Flash Memory

A Reliability Enhanced Address Mapping Strategy for Three-dimensional (3D) NAND Flash Memory
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三维 (3D) NAND 闪存的可靠性增强地址映射策略

DOI:
10.1109/tvlsi.2013.2288687
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发表时间:
2014
期刊:
IEEE Transactions on Very Large Scale Integration Systems (TVLSI)
影响因子:
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通讯作者:
Nikil D. Dutt
Nikil D. Dutt
中科院分区:
其他
文献类型:
--
作者:
Yi Wang;Zi Li Shao;Henry C. B. Chan;Luis Angel D. Bathen;Nikil D. Dutt

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