Test environment dependent discrete binomial-type software reliability models
Test environment dependent discrete binomial-type software reliability models
复制标题
测试环境相关的离散二项式软件可靠性模型
DOI：
10.1142/s0218539317500036
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发表时间：
2017
期刊：
影响因子：
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通讯作者：
Shinji Inoue and Shigeru Yamada
中科院分区：
文献类型：
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作者：
Inoue Shinji;Yamashita Naoya;Yamada Shigeru;Shinji Inoue and Shigeru Yamada
毫无疑问，测试阶段的软件可靠性增长过程取决于测试环境因素，如测试覆盖率、测试次数和调试技巧等，这些因素影响着测试阶段的软件故障发生或故障检测现象。在本文中，我们提出了软件可靠性模型，考虑到测试环境因素的影响。我们的模型是由程序大小相关的离散二项式型软件可靠性建模方法。这种建模方法也是一致的软件可靠性数据收集，使我们能够考虑程序大小的影响。最后，我们比较了我们的模型的精度方面的均方误差（MSE）和赤池的信息准则（AIC）与现有的相应的模型，通过使用实际数据。
We have no doubt that the software reliability growth process in the testing phase depends on the test environment factors, such as the attained testing coverage, the number of test-runs and the debugging skills, which affect the software failure occurrence or fault detection phenomenon in the testing phase. In this paper, we propose software reliability models that consider the effects of the testing environment factors. Our models are developed by a program size-dependent discrete binomial-type software reliability modeling approach. This modeling approach is also consistent with software reliability data collection and enables us to consider the effect of the program size. Finally, we compare the accuracy of our models in terms of mean square errors (MSE) and Akaike’s information criterion (AIC) with the existing corresponding model by using actual data.