Pulse length effects on autoionizing states under the influence of intense SASE XUV fields
Pulse length effects on autoionizing states under the influence of intense SASE XUV fields
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强 SASE XUV 场影响下的脉冲长度对自电离态的影响
DOI：
10.1088/1361-6455/abbe2d
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发表时间：
2020
期刊：
影响因子：
--
通讯作者：
T. Pfeifer
中科院分区：
文献类型：
--
作者：
L. Aufleger;P. Friebel;P. Rupprecht;A. Magunia;T. Ding;M. Rebholz;M. Hartmann;V. Stooß;C. Ott;T. Pfeifer
自电离态的法诺吸收线形状编码了其内部原子结构和动力学的信息。当在强极紫外（XUV）电场的近共振驱动下，吸收剖面可以被有意地修改，包括可观察到的线形不对称性和共振强度的变化，揭示了系统响应这种外部驱动的潜在动力学信息。我们报道了基于自放大自发发射（SASE）的统计展宽光谱的自由电子激光器（FEL）在高强度下可以实现的XUV脉冲参数的影响。更具体地说，以氦中的双激发2s2p共振为例，研究了FEL脉冲持续时间的影响，其中在弗劳恩霍夫型传输几何中，用XUV瞬态吸收光谱测量了线形变化。计算的低电平模型提供了不同的平均脉冲持续时间的随机FEL脉冲的影响。这些发现得到了在汉堡自由电子激光器（FLASH）上进行的测量的支持，并进一步深入了解了强高频FEL源驱动的XUV强耦合谐振跃迁动力学。
The Fano absorption line shape of an autoionizing state encodes information on its internal atomic structure and dynamics. When driven near-resonantly with intense extreme ultraviolet (XUV) electric fields, the absorption profile can be deliberately modified, including observable changes of both the line-shape asymmetry and strength of the resonance, revealing information on the underlying dynamics of the system in response to such external driving. We report on the influence of the XUV pulse parameters at high intensity that can be achieved with a free-electron laser (FEL) with statistically broadened spectra based on self-amplified spontaneous emission (SASE). More specifically, the impact of the FEL pulse duration is studied for the example of the doubly excited 2s2p resonance in helium, where line-shape modifications have been measured with XUV transient absorption spectroscopy in Fraunhofer-type transmission geometry. A computational few-level-model provides insight into the impact of different average pulse durations of the stochastic FEL pulses. These findings are supported by measurements performed at the Free-Electron Laser in Hamburg (FLASH) and provide further insight into XUV strong-coupling dynamics of resonant transitions driven by intense high-frequency FEL sources.
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影响因子：
64.8
作者：
Ott, Christian;Kaldun, Andreas;Pfeifer, Thomas
通讯作者：
Pfeifer, Thomas
DOI：
10.1088/0953-4075/47/12/124008
发表时间：
2014-06-28
影响因子：
1.6
作者：
Blaettermann, Alexander;Ott, Christian;Pfeifer, Thomas
通讯作者：
Pfeifer, Thomas
影响因子：
8.6
作者：
Kaldun, Andreas;Ott, Christian;Pfeifer, Thomas
通讯作者：
Pfeifer, Thomas
影响因子：
19.6
作者：
Ossiander, M.;Siegrist, F.;Schultze, M.
通讯作者：
Schultze, M.
影响因子：
56.9
作者：
Ott, Christian;Kaldun, Andreas;Pfeifer, Thomas
通讯作者：
Pfeifer, Thomas