A thin film 10B sample for measuring the atom number
A thin film 10B sample for measuring the atom number
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用于测量原子数的薄膜10B样品
DOI：
10.13538/j.1001-8042/nst.21.114-117
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发表时间：
2010
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影响因子：
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为了用前后向符合方法测量MeV中子引起的10B（n，α）7Li反应的微分截面，设计了10B薄膜样品，并以10B薄膜样品为参考样品测定了10B原子数。
In order to measure differential cross sections of the 10B(n,α)7Li reaction induced by MeV neutrons using the forward-backward coincidence method, a thin film 10B sample was designed and the 10B atom number was determined with a reference 10B film sample.