On the clathrate form of elemental silicon, Si136:: preparation and characterisation of NaxSi136 (X → 0)
On the clathrate form of elemental silicon, Si136:: preparation and characterisation of NaxSi136 (X → 0)
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DOI：
10.1016/j.solidstatesciences.2004.02.006
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发表时间：
2004-05-01
影响因子：
3.5
通讯作者：
Reny, E
中科院分区：
文献类型：
--
作者：
Ammar, A;Cros, C;Reny, E
硅的笼形物形式Si-136（也称为Si-34）具有低至35 ppm的残余钠含量（即，x类似于NaxSi 136中的0.0058），已经通过在高真空下热分解NaSi，随后在真空下进行几种其它处理来制备，并且通过与碘的重复反应来完成。通过XRD、电子探针显微分析、原子吸收、NMR和EPR等分析和光谱方法的组合确定了钠的残留量。后一种技术被证明是非常合适的非常稀释的钠原子在这种笼形结构的特性和定量测定其残留浓度。(C)2004年，Elsevier SAS。All rights reserved.
The clathrate form of silicon, Si-136 (otherwise known as Si-34), having a residual sodium content as low as 35 ppm (i.e., x similar to 0.0058 in NaxSi136), has been prepared by thermal decomposition of NaSi under high vacuum, followed by several other treatments under vacuum, and completed by repeated reactions with iodine. The residual amount of sodium has been determined by a combination of analytic and spectroscopic methods involving XRD, electron probe microanalysis, atomic absorption, NMR and EPR. This latter technique proved to be very appropriate to the characterisation of very diluted sodium atoms in such clathrate structure and to the quantitative determination of its residual concentration. (C) 2004 Elsevier SAS. All rights reserved.