HERMES: a soft X-ray beamline dedicated to X-ray microscopy
HERMES: a soft X-ray beamline dedicated to X-ray microscopy
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DOI：
10.1107/s1600577515007778
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发表时间：
2015-07-01
影响因子：
2.5
通讯作者：
Dalle, Didier
中科院分区：
文献类型：
--
作者：
Belkhou, Rachid;Stanescu, Stefan;Dalle, Didier
HERMES光束线（用于x射线显微镜和电子能谱的高效率和高分辨率光束线），建于同步加速器SOLEIL（法国圣奥班），专门用于软x射线显微镜。该光束线结合了两种互补的显微镜方法：XPEEM （x射线光发射电子显微镜）和STXM（扫描透射x射线显微镜），旨在达到20纳米以下的空间分辨率，并充分利用两种显微镜的局部光谱能力。两种方法在同一光束线内的可用性使用户能够选择合适的方法来研究他们在样品环境，光谱方法，探测深度等方面的具体情况。本文介绍了光束线的一般描述及其设计。我们将详细介绍光束线的性能和规格。此外，本文旨在演示如何优化光束线性能，以满足软x射线显微镜光束线在通量，分辨率，光束尺寸等方面的特定要求。特别注意克服软x射线光束线通常遇到的一些限制和阻碍问题，如碳污染、热稳定性和光谱纯度。
The HERMES beamline (High Efficiency and Resolution beamline dedicated to X-ray Microscopy and Electron Spectroscopy), built at Synchrotron SOLEIL (Saint-Auban, France), is dedicated to soft X-ray microscopy. The beamline combines two complementary microscopy methods: XPEEM (X-ray Photo Emitted Electron Microscopy) and STXM (Scanning Transmission X-ray Microscopy) with an aim to reach spatial resolution below 20 nm and to fully exploit the local spectroscopic capabilities of the two microscopes. The availability of the two methods within the same beamline enables the users to select the appropriate approach to study their specific case in terms of sample environment, spectroscopy methods, probing depth etc. In this paper a general description of the beamline and its design are presented. The performance and specifications of the beamline will be reviewed in detail. Moreover, the article is aiming to demonstrate how the beamline performances have been specifically optimized to fulfill the specific requirements of a soft X-ray microscopy beamline in terms of flux, resolution, beam size etc. Special attention has been dedicated to overcome some limiting and hindering problems that are usually encountered on soft X-ray beamlines such as carbon contamination, thermal stability and spectral purity.