Tail Departure of Log-Normal Grain Size Distributions in Synthetic Three-Dimensional Microstructures
Tail Departure of Log-Normal Grain Size Distributions in Synthetic Three-Dimensional Microstructures
复制标题
合成三维微观结构中对数正态晶粒尺寸分布的尾部偏离
DOI：
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发表时间：
2012
期刊：
影响因子：
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通讯作者：
A. Rollett
中科院分区：
文献类型：
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作者：
Joseph C. Tucker;L. Chan;G. Rohrer;M. Groeber;A. Rollett
通常认为多晶材料具有对应于对数正态分布的晶粒尺寸分布。统计体积单元可以使用这种几何形状分布来模拟单相多晶。然而，当对数正态分布用于晶粒尺寸时，它可能会产生实际上无法容纳在有限模拟体积中的非物理大晶粒。应用其他分布可以更好地控制上尾部，例如截断分布，可以解决问题并允许生成更具代表性的分布。这些要点通过生成代表镍基高温合金 Inconel 100 的合成三维 (3-D) 微观结构的示例进行了说明，该合金表现出与对数正态分布显着的上尾偏差。还将讨论孪生插入，代表退火孪生。
Polycrystalline materials are generally thought to have grain size distributions that correspond to log-normal. Statistical volume elements can use such geometric shape distributions to simulate single-phase polycrystals. When the log-normal distribution is used for grain size, however, it can give rise to nonphysical large grains that cannot be practically accommodated in finite simulation volumes. The application of other distributions that afford better control of the upper tails, e.g., truncated distributions, resolves the problem and allows more representative distributions to be generated. These points are illustrated with an example of generation of a synthetic three-dimensional (3-D) microstructure to represent the nickel-based superalloy Inconel 100, which exhibits significant upper tail departure from log-normal. Twin insertion, to represent annealing twins, will also be discussed.