Photoionization microscopy for a hydrogen atom in parallel electric and magnetic fields
Photoionization microscopy for a hydrogen atom in parallel electric and magnetic fields
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平行电场和磁场中氢原子的光电离显微镜
DOI：
10.1103/physreva.93.063411
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发表时间：
2016
影响因子：
2.9
通讯作者：
Liu H. P.
中科院分区：
文献类型：
--
作者：
Deng M.;Gao W.;Lu Rong;Delos J. B.;You L.;Liu H. P.
在光电离显微镜实验中，原子被置于静态外场中，被激光电离，电子福尔斯落在位置敏感探测器上。到达探测器上各个点的电子电流取决于原子的初始状态、电子被共振或非共振激发的激发态以及从原子到探测器上最终点的各种路径。我们在这里报告的量子力学计算的光电离显微镜在平行的电场和磁场。我们特别关注共振激发态产生的图案。我们表明，磁场基本上修改这些共振状态，限制它们在径向方向上，它有很强的影响在检测器上的干涉图案。
In photoionization microscopy experiments, an atom is placed in static external fields, it is ionized by a laser, and an electron falls onto a position-sensitive detector. The current of electrons arriving at various points on the detector depends upon the initial state of the atom, the excited states to which the electron is resonantly or nonresonantly excited, and the various paths leading from the atom to the final point on the detector. We report here quantum-mechanical computations of photoionization microscopy in parallel electric and magnetic fields. We focus especially on the patterns resulting from resonant excited states. We show that the magnetic field substantially modifies some of these resonant states, confining them in the radial direction, and that it has a strong effect on the interference pattern at the detector.