Direct Growth of Single- and Few-Layer MoS2 on h-BN with Preferred Relative Rotation Angles.
Direct Growth of Single- and Few-Layer MoS2 on h-BN with Preferred Relative Rotation Angles.
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DOI:
10.1021/acs.nanolett.5b01311
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发表时间:
2015-04
期刊:
影响因子:
10.8
通讯作者:
A. Yan;J. Velasco;S. Kahn;Kenji Watanabe;T. Taniguchi;Feng Wang;M. Crommie;A. Zettl
中科院分区:
文献类型:
--
作者:
A. Yan;J. Velasco;S. Kahn;Kenji Watanabe;T. Taniguchi;Feng Wang;M. Crommie;A. Zettl
Monolayer molybdenum disulfide (MoS2) is a promising two-dimensional direct-bandgap semiconductor with potential applications in atomically thin and flexible electronics. An attractive insulating substrate or mate for MoS2 (and related materials such as graphene) is hexagonal boron nitride (h-BN). Stacked heterostructures of MoS2 and h-BN have been produced by manual transfer methods, but a more efficient and scalable assembly method is needed. Here we demonstrate the direct growth of single- and few-layer MoS2 on h-BN by chemical vapor deposition (CVD) method, which is scalable with suitably structured substrates. The growth mechanisms for single-layer and few-layer samples are found to be distinct, and for single-layer samples low relative rotation angles (<5°) between the MoS2 and h-BN lattices prevail. Moreover, MoS2 directly grown on h-BN maintains its intrinsic 1.89 eV bandgap. Our CVD synthesis method presents an important advancement toward controllable and scalable MoS2-based electronic devices.