Harsh Parenting and Child Externalizing Behavior: Skin Conductance Level Reactivity as a Moderator
Harsh Parenting and Child Externalizing Behavior: Skin Conductance Level Reactivity as a Moderator
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DOI：
10.1111/j.1467-8624.2009.01280.x
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发表时间：
2009-03-01
影响因子：
4.6
通讯作者：
Cummings, E. Mark
中科院分区：
文献类型：
--
作者：
Erath, Stephen A.;El-Sheikh, Mona;Cummings, E. Mark
Skin conductance level reactivity (SCLR) was examined as a moderator of the association between harsh parenting and child externalizing behavior. Participants were 251 boys and girls (8-9 years). Mothers and fathers provided reports of harsh parenting and their children's externalizing behavior; children also provided reports of harsh parenting. SCLR was assessed in response to a socioemotional stress task and a problem-solving challenge task. Regression analyses revealed that the association between harsh parenting and externalizing behavior was stronger among children with lower SCLR, as compared to children with higher SCLR. SCLR may be a more robust moderator among boys compared to girls. Results are discussed with regard to theories on antisocial behavior and multiple-domain models of child development.
