A Large-scale Empirical Study on the Vulnerability of Deployed IoT Devices
A Large-scale Empirical Study on the Vulnerability of Deployed IoT Devices
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已部署物联网设备漏洞的大规模实证研究
DOI:
10.1109/tdsc.2020.3037908
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发表时间:
2020
影响因子:
7.3
通讯作者:
Raheem Beyah
中科院分区:
文献类型:
--
作者:
Binbin Zhao;Shouling Ji;Wei-Han Lee;Changting Lin;Haiqin Weng;Jingzheng Wu;Pan Zhou;Liming Fang;Raheem Beyah