Aqueous Solution Structure over α-Al2O3(011̅2) Probed by Frequency-Modulation Atomic Force Microscopy
Aqueous Solution Structure over α-Al2O3(011̅2) Probed by Frequency-Modulation Atomic Force Microscopy
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DOI：
10.1021/jp1057447
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发表时间：
2010-11
影响因子：
3.7
通讯作者：
Takumi Hiasa;K. Kimura;H. Onishi;M. Ohta;Kazuyuki Watanabe;Ryohei Kokawa;N. Oyabu;K. Kobayashi;Hirofumi Yamada
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文献类型：
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作者：
Takumi Hiasa;K. Kimura;H. Onishi;M. Ohta;Kazuyuki Watanabe;Ryohei Kokawa;N. Oyabu;K. Kobayashi;Hirofumi Yamada
将α-Al 2 O3（0112）晶片浸渍在1 mol L-1的KCl水溶液中，用调频原子力显微镜进行观察。尖端-表面力被精确地确定为尖端-表面距离的函数。力-距离关系包含振荡，伴随着指数衰减的双电层力。力的振荡被归因于限制在Al 2 O3表面的液态水层。
An α-Al2O3(0112) wafer was immersed in an aqueous KCl solution of 1 mol L−1 and observed with a frequency-modulation atomic force microscope. The tip−surface force was precisely determined as a function of the tip−surface distance. The force−distance relationship contained oscillations accompanied with an exponentially decayed, electric double layer force. The force oscillations were ascribed to liquid water layers confined over the Al2O3 surface.