A reflection-mode apertureless scanning near-field optical microscope developed from a commercial scanning probe microscope
A reflection-mode apertureless scanning near-field optical microscope developed from a commercial scanning probe microscope
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由商用扫描探针显微镜发展而来的反射式无孔径扫描近场光学显微镜
DOI：
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发表时间：
1998
期刊：
影响因子：
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通讯作者：
P. Royer
中科院分区：
文献类型：
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作者：
G. Wurtz;R. Bachelot;P. Royer
我们从商用扫描探针显微镜（SPM）发展了一种多价反射模式无孔径扫描近场光学显微镜（SNOM）。在解释了我们的动机之后，我们精确地描述了仪器，通过指定我们如何将光学元件集成到初始SPM，通过利用其特性，并且不修改其初始功能。该仪器允许五种不同的反射模式SNOM配置，并能够进行偏振研究。可以使用三种类型的SNOM探头：电介质、半导体和金属探头。后者是自制的探针，其成功的使用，作为原子力显微镜的探针，由商业SPM已被实验证明。使用氮化硅（电介质）探针，五种配置之一已实验测试两个样品。第一个样品是由玻璃衬底上的纳米铝点制成的，第二个样品是激光二极管的输出前端面。Prelimi...
We have developed a polyvalent reflection-mode apertureless scanning near-field optical microscope (SNOM) from a commercial scanning probe microscope (SPM). After having explained our motivations, we describe the instrument precisely, by specifying how we have integrated optical elements to the initial SPM, by taking advantage of its characteristics, and without modifying its initial functions. The instrument allows five different reflection-mode SNOM configurations and enables polarization studies. Three types of SNOM probes can be used: dielectric, semiconducting, and metallic probes. The latter are homemade probes whose successful use, as probes for atomic force microscopy, by the commercial SPM has been experimentally demonstrated. Using silicon–nitride (dielectric) probes, one of the five configurations has been experimentally tested with two samples. The first sample is made of nanometric aluminum dots on a glass substrate and the second sample is the output front facet of a laser diode. The prelimi...