High Resolution Electron Microscopy In Situ Observation of Dynamic Behavior of Grain Boundaries and Interfaces at Very High Temperatures
High Resolution Electron Microscopy In Situ Observation of Dynamic Behavior of Grain Boundaries and Interfaces at Very High Temperatures
复制标题
高分辨率电子显微镜原位观察极高温度下晶界和界面的动态行为
DOI：
10.1017/s143192769797029x
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发表时间：
1997
影响因子：
2.8
通讯作者：
H. Saka
中科院分区：
文献类型：
--
作者：
T. Kamino;K. Sasaki;H. Saka
高温下晶界和界面动态行为的高分辨电镜原位观察
High Resolution Electron Microscopy In Situ Observation of Dynamic Behavior of Grain Boundaries and Interfaces at Very High Temperatures