Non-destructive measurement of photoexcited carrier transport in graphene with ultrafast grating imaging technique
Non-destructive measurement of photoexcited carrier transport in graphene with ultrafast grating imaging technique
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超快光栅成像技术无损测量石墨烯中光生载流子输运
DOI:
10.1016/j.carbon.2016.05.075
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发表时间:
2016-10-01
期刊:
影响因子:
10.9
通讯作者:
Wang, Yaguo
中科院分区:
文献类型:
--
作者:
Chen, Ke;Yogeesh, Maruthi Nagavalli;Wang, Yaguo
Graphene has great potential for fabrication of ultrafast opto-electronics, in which relaxation and transport of photoexcited carriers determine device performance. Even though ultrafast carrier relaxation in graphene has been studied vigorously, transport properties of photoexcited carriers in graphene are largely unknown. In this work, we utilize an ultrafast grating imaging technique to measure lifetime (tau(r)), diffusion coefficient (D), diffusion length (L) and mobility (mu) of photoexcited carriers in mono-and multi-layer graphene non-invasively. In monolayer graphene, D similar to 10,000 cm(2)/s and mu similar to 120,000 cm(2)/V have been observed, both of which decrease drastically in multilayer graphene, indicating that the remarkable transport properties in monolayer graphene originate from its unique Dirac-Cone energy structure. Mobilities of photoexcited carriers measured here are several times larger than the Hall and Field-Effect mobilities reported in literature (